Used ACCRETECH / TSK Win-Win 50 #9163072 for sale

ACCRETECH / TSK Win-Win 50 is a semi-automated mask and wafer inspection equipment used for surface inspection of wafers used in the semiconductor industry. The system is designed for both standard CMOS devices and high-end memory ICs. It is capable of providing high-speed inspection to detect minute defects in the form of particles, scratches, and various other anomalies. The unit is composed of an interactive user control monitor, which is plugged to a machine host computer. It is equipped with a high-precision XY stage and a high-resolution optical tool, which is capable of providing a maximum working distance of 260mm between the wafer and the camera. This allows for precise positioning of the wafer for the inspection process. A variable angle of up to ±15°of tilt capability is also provided for the microscope lens, allowing for easy detection of defects that may not be visible to the naked eye due to the curvature of the wafer surface. TSK Win-Win 50 utilizes an TSK VisionTools Inspection Asset to facilitate detection of defects on wafer as small as 0.3 micrometers. The software includes the defect-editing function, which allows for quick and accurate editing of detected defects, enabling faster process flow. It also offers advanced algorithms to accurately recognize defects by type, size, and position. The model also includes a Device Characterization software package, which allows for automated measurement of device geometry, such as surface width, line width, and pitch. This allows for easy evaluation of the device performance and pinpoint the defects that need to be addressed for improved device quality. ACCRETECH WIN WIN 50 is designed to operate in a variety of standard clean room environments, and features several air purification systems built into the equipment, providing clean air for system operation and wafer inspection. With its intuitive user interface and easy-to-use features, this unit is well-suited to meet the needs of advanced semiconductor production.