Used ADE / KLA / TENCOR 9500 UltraGage #9171282 for sale

ADE / KLA / TENCOR 9500 UltraGage is a wafer testing and metrology equipment designed to provide highly accurate test and measurement results for a range of wafer sizes. The system features a high-resolution scanning unit, high-speed imaging capabilities, and a broad range of application-specific tools and configurations. ADE 9500 UltraGage is equipped with a state-of-the-art CCD imaging machine that enables high-precision wafer measurements. The tool has a stage that can traverse full 300 mm wafers, enabling it to test large devices with a high degree of accuracy. It also has the capability to image large quantities of data with the increased resolution and speed of its CCD imaging asset. KLA 9500 UltraGage has a high-speed image analysis model that makes it capable of providing excellent performance for surface metrology tests. The equipment has a high-sensitivity imaging system, with a high level of resolution that enables precise measurements. It also has a low noise level and optimized loading process, making it very efficient and accurate. The unit has a wide range of application-specific tools for surface metrology tests. It also has a suite of software tools for non-contact wafer analysis, including contour and profile mapping. These tools allow for precise surface defect detection, defect sizing, and a variety of other wafer measurements. At the same time, TENCOR 9500 UltraGage is also designed to provide high-speed data collection and analysis. Its high-speed imaging capabilities enable it to collect and analyze very large quantities of data quickly and accurately. It also has a high sampling rate of up to 11 Million pixels per second, making it highly efficient. 9500 UltraGage is a powerful and versatile wafer testing and metrology machine. Its high-precision, high-speed imaging capabilities and range of application-specific tools make it an ideal solution for a variety of wafer tests. The tool provides an optimised loading process and high-speed data collection and analysis, enabling accurate and efficient test and measurement results.