Used ADVANCED METROLOGY SYSTEMS (AMS) IR3100 #9100377 for sale

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ADVANCED METROLOGY SYSTEMS (AMS) IR3100
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ID: 9100377
Wafer Size: 12
Etch depth measuring systems, 12".
Taking mask and wafer inspection to the next level, Advanced Metrology Systems (AMS) ADVANCED METROLOGY SYSTEMS (AMS) IR3100 is the premier choice for superior scanning and detection capabilities. This downstream process inspection equipment provides a robust solution that combines cutting-edge hardware and intuitive software, enabling manufacturers to identify defects quickly and accurately. From die-to-die inspection to wafer mapping, the AMS IR3100's advanced technology offers unparalleled precision and reliability. The system has been designed with an ergonomic vision, offering excellent accessibility to components and easy adjustment, so that operators can benefit from a usability-oriented environment. Additionally, ADVANCED METROLOGY SYSTEMS (AMS) IR3100 features an automated goniometer cassette, which provides superior accuracy, speed, and versatility compared to traditional motorized goniometers. This feature also ensures consistent and reliable measurements, while reducing the number of calibration steps. The AMS IR3100 provides an ultra-high resolution inspection unit that is capable of scanning up to 4M pixels. It can detect defects with a size as low as 4 microns, which is essential for accurately evaluating wafer structures. The powerful imaging technology also allows manufacturers to perform complex wafer mapping and measure parameters. This makes the machine suitable for a range of industries, from consumer electronics to satellite communications. In addition to to its detection and imaging capabilities, ADVANCED METROLOGY SYSTEMS (AMS) IR3100 also provides a suite of automated metrology functions. These include multiplexing capability, which allows operators to perform multiple tasks simultaneously; enhanced binarization for fast and accurate measurement of images; a 2D inspection engine for accurate defect detection; and a reporting engine for complex wafer information. All these functions are designed to ensure that the tool meets the highest standards of accuracy and repeatability. In conclusion, the Advanced Metrology Systems (AMS) IR3100 is an advanced mask and wafer inspection asset that provides superior scanning capabilities. Its advanced technology enables fast and reliable defect detection and measurement, while the automated metrology functions enable users to perform complex tasks with ease and accuracy. Its ergonomic features provide excellent accessibility and make the model a worthy choice for manufacturers looking for a reliable solution for their mask and wafer inspection needs.
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