Used KLA / TENCOR 2401 Viper #9195297 for sale

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ID: 9195297
Wafer Size: 4"-8"
Vintage: 2000
Wafer inspection system, 4"-8" Cassette to cassette system Compatible wafer carriers: 4, 5, 6, 8 (2) Cassette ports Unit set up: 8" Optical measurement unit Operating system: Windows NT Throughput: 85 W / H Wafer mapping Double discharge lamp: Wafer illumination Particles and scratches macro inspection: > 50 microns Instant pictures: 1 KB x 1 KB with 2 linear CCDs Stage moving: Y Axis 2000 vintage.
KLA / TENCOR 2401 Viper is an automated mask and wafer inspection equipment designed to detect pattern defects with high accuracy and reliability. The system is composed of two scanning lasers that are used to analyze the surface of mask and wafer samples for any irregularities. This process is known as defect review. The unit uses a unique two laser machine called "Perception" to accurately identify defects. The tool utilizes two independent scanning lasers to gather defect review information from different angles simultaneously. This helps reduce the amount of time needed to inspect a sample, as well as improves the accuracy of the results. In addition, the asset includes advanced algorithms that can detect anomalies that are difficult to detect with traditional methods. KLA 2401 Viper's imaging capabilities enable users to quickly review sample images, which are displayed on the integrated user interface. The image resolution is selectable to various settings for various phases of the inspection process including defect repair, defect isolation, pass/fail, and alignment. The model also uses a high-accuracy optical stage to accurately move the wafer or mask sample in 3-axis direction. This allows for greater control over the whole process. The integrated calibration software enables users to maintain consistent scanning parameters across the equipment. Furthermore, the system is equipped with a bar code reader, which enables inspection data to be quickly and accurately recorded. Finally, TENCOR 2401 Viper's software package offers a comprehensive set of features to ensure the highest levels of reliability and accuracy when inspecting wafers and masks. These features include an image review tool, a defect identification and location tool, an automatic user guide, comprehensive data and defect reporting, and tools for easily backing up and storing data. All of these features make 2401 Viper an ideal choice for a variety of mask and wafer inspection tasks.
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