Used KLA / TENCOR SP2 #9186620 for sale

KLA / TENCOR SP2 is a state-of-the-art, high-performance mask and wafer inspection equipment. It uses patented technologies and advanced imaging techniques to reliably detect and identify manufacturing defects on maske and wafer surfaces with unprecedented accuracy and speed. KLA SP-2 is designed to detect a wide range of defects and offer unparalleled visibility, with an inspection speed up to 10X faster than conventional tools. TENCOR SP 2 employs an advanced and fully automated inspection system that effectively scans large wafers, allowing production efficiency to be maximized. This unit uses a sophisticated combination of software, lasers, imaging technologies, and iterative processes to detect a wide array of possible defect types. Its unique optical design and advanced algorithms enables SP 2 to quickly inspect large wafers and detect defects on fine-pitch features. With its fully automated machine, TENCOR SP2 can quickly and accurately identify possible defect types. In addition to its impressive scanning capabilities, KLA SP 2 offers advanced imaging capabilities which are designed to provide superior defect detection. These capabilities include edge detection, dark erosion inspection, dark defect detection, and more. Edge detection enables the tool to detect defects on fineline patterns, dark erosion provides information to detect fine extended defects, and dark defect detection provides information to detect pinholes, crystal defects, particle, and other defects. Furthermore, SP2's intuitive user interface makes operating the asset a breeze. The easy-to-use graphical display and intuitive controls allow for an efficient and streamlined workflow. The model can be fully configured to meet specific customer requirements, allowing for further efficiency gains. Beyond its impressive scanning and imaging capabilities, KLA / TENCOR SP 2 carries numerous additional features that further make it a leading equipment in the field. It includes an automatic mask alignment system, various customizable scan modes and detectors, and advanced signal processing. SP-2 also offers a number of post-processing modules that improve effectiveness of defect reporting and streamline the process further. In conclusion, KLA / TENCOR SP-2 is a feature-packed and reliable mask and wafer inspection unit that offers remarkable levels of accuracy, speed, and efficiency. It employs advanced scanning technologies, imaging capabilities, and a user-friendly interface to provide unparalleled visibility into possible defect types. With its highly reliable and intuitive operation, KLA SP2 is an ideal choice for those looking for a powerful and efficient inspection machine.