Used KLA / TENCOR 2401 Viper #9186868 for sale

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ID: 9186868
Macro-defect inspection system.
KLA / TENCOR 2401 Viper is an automated mask and wafer inspection tool designed to provide comprehensive defect-detection capabilities. It is used in the semiconductor manufacturing process to inspect mask, wafer, and die surfaces for defects or contaminants. KLA 2401 Viper utilizes advanced pattern recognition algorithms and optics to detect and classify image defects. It is equipped with a high-resolution color CCD camera, a polarization module, and a white-light LED illuminator, which capture and analyze images of the inspected mask or wafer. TENCOR 2401 Viper also includes an automated stage for moving the mask or wafer into and out of the inspection zone. 2401 Viper offers high-speed production-level inspections with extremely low-noise performance. It is capable of operating at up to 60 wafers per hour and can detect defects as small as 1 micron. KLA / TENCOR 2401 Viper can also inspect large areas and high aspect ratios, which allows for increased wafer-to-mask compatibility. The user-friendly interface of KLA 2401 Viper includes full-featured text, graphics, and sound alarms to indicate just detected anomalies. It also incorporates an on-board library of filter and scan parameters to optimize the performance of the system. The library can be configured to accommodate different sampling points on wafer edges or reticle grids, enabling users to maximize yield and throughput. TENCOR 2401 Viper also features all-in-one detection technology, which can detect a wide range of defect types, from foreign particles to voids or pits. The system combines both automated and manual inspections, allowing for precise defect selection and classification. The system can further be pre-programmed with background-matching algorithms to filter out low intensity or low probability anomalies. 2401 Viper is an effective and reliable mask and wafer inspection tool designed to detect small anomalies, reduce operational costs, and optimize yield. Through its high-speed and advanced defect classification capabilities, KLA / TENCOR 2401 Viper offers increased throughput while providing users with precise intelligence in the inspection process.
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