Used LEICA / VISTEC LWS 3000 CFI #9155206 for sale

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ID: 9155206
Wafer measurement system 1993 vintage.
LEICA / VISTEC LWS 3000 CFI is a state-of-the-art mask and wafer inspection equipment. It provides comprehensive capabilities for the inspection of integrated circuit (IC) production masks, including commonly used lithography and electron-beam imaging technologies. Using advanced inspection and metrology techniques, LEICA LWS 3000 CFI offers real-time, in-depth analysis of mask patterns and defects. This includes comprehensive defect classifications, making use of a sophisticated feature-recognition technology to capture even the smallest variations in the fine lines and shapes of the mask patterns. High-resolution imaging is provided through an automated optical system, while electron beam imaging is available via dual-beam ion source technology. Accurate measurements can be taken and aligned to within 1.0 um to ensure the accuracy and repeatability of the results. This precision metrology tool also features a 4-inch original space mirror camera to ensure all measurements are taken from the same exact position. VISTEC LWS 3000 CFI also features versatile automation capabilities, allowing it to work efficiently from the production floor to the lab. This includes a powerful visualisation and management unit that provides traceability of inspection results. The automated machine Logbook stores all data in a secure, cloud-based tool for future access and analysis. The asset meets the requirements of modern mask production, giving the user the confidence of a thoroughly inspected, verified mask. It is excellent for ensuring quality control from start to finish, providing reliable performance and productivity even in highly demanding mask production environments. In conclusion, LWS 3000 CFI enables reliable performance and automated inspection for production masks. Its precise measure and feature-recognition capabilities enable rapid, cost-effective production, while its automated features minimize user effort and lead to reduced processing times. Highly accurate measurements offer unparalleled accuracy and repeatability, making LEICA / VISTEC LWS 3000 CFI an ideal choice for mask production and inspection.
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