Used NANOMETRICS / BIO-RAD / ACCENT Vertex #9182094 for sale

NANOMETRICS / BIO-RAD / ACCENT Vertex is a leading-edge mask and wafer inspection equipment for semiconductor fabrication new product introduction (NPI) quality assurance. It gives a complete solution to rapidly identify non-conformances on multiple mask layers for critical and non-critical device layers. This tool helps to increase yield and reduce time to market. The system is a small field-emission scanning electron microscope (FESEM) combined with a fast and accurate bright field imaging unit. It uses a patented ACCENT Vertex imaging machine for defectivity inspection at up to 25 microns (μm) resolution. It scans signals from multiple layers—from resist and photomask etch to organic thin films and photomask—and rapidly detects and evaluates defects. It is also able to detect particles, scratches, and other non-conformances and flag them for further assessment. BIO-RAD Vertex includes advanced imaging capabilities, such as 3D mapping and automatically classified critical defects. It also incorporates high-speed automated navigation, allowing it to quickly assess large area defects and identify possible changes in the material structure. It processes large image datasets to facilitate defect recognition and accuracy of the defect detection on multiple layers and defects occurring on the same die size. Vertex offers extensive tools and capabilities that make it suitable for a wide range of applications, including defect review, yield monitoring, process optimization, and high-index defect inspection. In addition, its capabilities span from automated defect detection to full critical defect analysis, enabling reliable and efficient mask production. The company provides NANOMETRICS Vertex with a wide range of services, including defect analysis, yield analysis, advanced analytics, and reporting. These services offer manufacturers a comprehensive solution for inspection and quality assurance. Furthermore, it offers a secure and reliable platform for defect management and defect traceability. NANOMETRICS / BIO-RAD / ACCENT Vertex is a powerful and reliable mask and wafer inspection tool for semiconductor fabrication. Its advanced imaging capabilities, high-speed navigation systems, and extensive services make it an ideal choice for a variety of manufacturing tasks. The asset is highly configurable and can be tailored to specific requirements.