Used ZYGO GPI LC #9031761 for sale
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ID: 9031761
Wafer Size: 6"
Vintage: 2001
Interferometer
Camera inside LC
Video monitor for display
Transmission flat, 6"
Test beam diameter options: 4" (102 mm), 6" (152 mm)
Configuration options:
Horizontal
Vertical 3 rods downward looking / Upward looking
Optical center line: 4.25" (108 mm)
Alignment system: Quick fringe acquisition system (QFAS)
With twin spot reticle
Zoom range: 6:1 (GPI ST)
Alignment field of view:
4" ±3°
6" ±2°
Pupil focus range: ±100 mm, 4" aperture
Part viewing: 9" Monitor
Video output: 525 lines / 60 Hz (2:1 interlace) RS-170 / 625 lines / 60 Hz
System quality:
Plano testing: λ/20
Spherical testing: λ/10
Type: Helium-neon, class II
Wavelength: 632.8 nm
Beam polarization: Circular
Coherence length: > 328 ft
2001 vintage.
ZYGO GPI LC is a mask and wafer inspection equipment that is designed for production environments. It is a powerful tool that combines high-speed optical inspection technology with intelligent machine learning algorithms. With its touchscreen, intuitive user interface, and built-in inspection algorithms, ZYGO GPI-LC ensures accurate results in a wide variety of mask and wafer inspection scenarios. GPI LC is designed for high-speed optical inspection, allowing users to capture detailed images of circuit patterns, defects, opaques, layout issues, and other design-related issues. Using top-of-the-line optics, GPI-LC is able to scan and inspect a wide area on a wafer at high speeds, making it ideal for production level inspections. ZYGO GPI LC also features advanced built-in algorithms for identifying defects, as well as a defect density display for assessing the quality of a particular area. Its touch screen interface makes ZYGO GPI-LC easy to use for both experienced operators and new users alike. GPI LC also features an intuitive user-friendly graphical interface that makes navigating through the different modes and settings straightforward. This helps to minimize the time it takes an operator to get comfortable with the system. Additionally, GPI-LC uses a Machine Learning (ML) tool to create an intelligent mask layout that can be used to expedite debugging processes, reduce faults, and improve overall accuracy of the unit. This Machine Learning feature allows ZYGO GPI LC to learn over time so it can provide feedback to the user and enable more accurate results in a shorter time. ZYGO GPI-LC is a powerful mask and wafer inspection machine that is designed to provide fast and reliable results in production environments. It combines high-speed optical inspection technology with intelligent machine learning algorithms to deliver accurate and timely results. Its intuitive user interface and built-in algorithms make it easy for operators to use, while its machine learning tool helps to improve accuracy over time.
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