Used ZYGO GPI XP #9181375 for sale

ZYGO GPI XP mask and wafer inspection equipment offers non-contact 3D measurement and inspection capabilities for advanced technology lithography and metrology applications. This system features a patented optical unit that enables the machine to capture up to 16 million points per wafer in a fraction of a second with no moving components required. It also provides unparalleled accuracy and repeatability of the measurements compared to traditional systems. ZYGO GPIXP tool is configurable to support a variety of advanced semiconductor metrology applications such as photo-mask inspection, overlay metrology, CD metrology, and surface finish. It has an ultra-fast acquisition process for fast and accurate imaging of semiconductor masks and wafers, allowing manufacturers to reduce their turnaround times for critical production tasks. The robust design of the asset also makes it highly reliable and versatile. The model is designed to support a variety of mask forms, including standard masks, advanced lithography masks, and MEMS masks. It is also compatible with various substrates, such as Si, GaAs, and ceramic. GPI-XP is also compatible with a variety of imaging systems, including SEM and TEM systems. This makes the equipment capable of supporting a wide range of inspection and metrology tasks over a large range of tasks. The system has an intuitive user interface for data collection and analysis that makes it easy to use and configure. It also has multiple software modules for data storage and analysis, allowing users to easily store, manipulate, and analyze collected data. It is also equipped with a range of intelligent algorithms to reduce false positives and false negatives, ensuring an accurate measurement of mask geometry and wafer features. In addition, the unit has a number of safety features and security protocols to protect data, equipment, and personnel. Furthermore, it has an advanced machine of alarms and sensors that alerts the user in case of an issue and helps prevent any possible damage. GPI XP is a comprehensive inspection and metrology tool designed to effectively meet the stringent requirements of the most advanced lithographic and metrology applications. Its features, accuracy, reliability, flexibility, and safety make it an ideal choice for semiconductor device manufacturers and related industries.