Used AKRION GAMA #9154699 for sale

AKRION GAMA (Generic Advanced Metrology Analyzer) is a sophisticated solution for a wide range of non-contact metrology applications in the microelectronics industry. Using advanced scanning microscope technologies, the equipment is capable of measuring a broad scope of wafer parameters with high precision and accuracy. GAMA focuses on parameters such as edge and distance inspection, step height, flatness, size, shape recognition, thickness, coplanarity, and surface inspection. The system is non-destructive and employs a telecentric optical unit, which ensures accurate measurements across the entire wafer with minimal drift. Utilizing laser scanning and interferometric techniques, AKRION GAMA produces 3D map measurements of the entire sample in a single scan. This enable the analysis of features with a high degree of confidence, for example the detection of particle contamination. GAMA consists of a user-friendly control module, an automated wafer handling machine, a high-resolution imaging tool, and a sample positioning asset. The control module is PC-based and runs stand-alone, allowing for intelligent control of the entire model. The automated wafer handling equipment can handle up to 300-mm wafers in a wide variety of sizes. The high-resolution imaging system has an axial resolution of 0.5 micron and is capable of acquiring up to 1.0 million lines of image data in a single scan. The sample positioning unit enables sub-micron accurate measurements. The alignment of the sample is ensured by an automatic calibration routine that scans several gauge points around the entire wafer. The machine can measure any non-destructive sample, as long as it fits within the standard sample holders. AKRION GAMA comes with powerful data processing and analysis software. The software can be used to visualize, analyze, and report results for small and large samples. The tool also includes GAMA-specific scripts that allow users to customize the software to fit their particular application and requirements. AKRION GAMA provides a powerful, accurate, and reliable solution for a wide range of wafer processing applications, from substrate identification and measurement to advanced particle detection and failure analysis. Its flexible configuration and automated control make GAMA a perfect choice for any wafer processing needs.