Used DNS / DAINIPPON STM-603-PLS #9121891 for sale

DNS / DAINIPPON STM-603-PLS is a high performance mask and wafer inspection equipment designed specifically to increase yield and reliability within the semiconductor manufacturing process. This system is equipped with revolutionary optical technology, the Silicon Edge Sensor 2, which delivers superior performance and extremely accurate measurements of critical edge structures. The unit is equipped with powerful software, enabling the user to easily identify and isolate any potential defects in the manufacturing process. The machine has a user-friendly graphical interface that makes it easy to navigate menus and access functions and features. It's equipped to measure a wide range of characteristics, including analyzing photoresist, graininess, line width roughness, parabolic illumination, non-contact measurements, and other edge-to-edge structures. DNS STM-603-PLS's advanced optical technology has the capability to detect small scale defects, as well as large scale defects such as false edges and non-uniformity of light. This tool includes a high detection speed, along with its advanced accuracy in constant measurements. Additionally, the tool offers the ability to measure microscopic variation in the mask pattern using an automated alignment technology. The asset is built with a large image memory, enabling the user to take multiple images of the same defect, ensuring that all relevant data is collected and stored for future analysis. Additionally, the model includes software that can measure and analyze the image data on various fields of the mask pattern to identify pattern-dependent artifacts and other unwanted features. This software also can generate a dynamic chart and a SPC chart with statistics. DAINIPPON STM-603-PLS assists the user in low cost mask and wafer inspection, reducing production cost and improving process reliability. Moreover, the equipment can be used as an extra quality assurance tool for improving in-line manufacturing or for a final process audit. Additionally, the system can reduce scrap and improve yield rate by uncovering potential defects in the early stages of the production process. Overall, STM-603-PLS provides a user-friendly platform for efficient, accurate and cost-effective mask and wafer inspection. It offers powerful software that enables the user to leverage advanced analytical capabilities, to provide a robust tool for inspecting and identifying defects within the semiconductor manufacturing process.