Used ACCRETECH / TSK UF 200S #9194569 for sale

ACCRETECH / TSK UF 200S Prober is an ultra-high precision, high-speed and high-reliability prober designed to meet the needs of semiconductor research and testing. The prober features a streamlined design that combines maximum accuracy with minimum intruder detection and noise. It is capable of handling up to 135 mm wafer size, making it ideal for both large and small scale semiconductor testing. TSK UF200S Prober utilizes a unique scanning-beam reflection probe technology (SBRT) which is capable of reaching submicron probe measurements. This technology has two adjustable nano-positioners and an integrated laser alignment equipment. The SBRT system is capable of providing nanometer accuracy in vertical and lateral movements. Furthermore, the unit is equipped with highly efficient vibration control systems, electromagnetic interference protection and high-speed data acquisition capability. The prober comes equipped with two ultra-precision microscopes - a 5X objective lens, and a 10X stereomicroscope, both of which can achieve magnifications up to 200X. The microscopes have an adjustable focal range and are optimally designed to reduce bloom and glare, allowing for highly detailed analysis of wafer image data. The prober also features an inbuilt autofocus machine and is capable of providing a higher degree of accuracy compared to manual focusing. In addition, ACCRETECH UF 200 S Prober features an integrated probe card positioning and insertion tool. This asset uses three-dimensional translation and rotation techniques to accurately insert and accurately position the probe cards. This model is also equipped with an automated core recognition technology, which is able to identify the geometry of the probe card and ensure that the card is correctly aligned. Overall, UF200S Prober is an incredibly capable and reliable instrument for semiconductor testing and research. Its high accuracy and efficiency make it ideal for a wide range of applications from testing large production runs to more detailed research studies. With its streamlined design, robust construction and unique probing technology, it is an excellent choice for any semiconductor testing needs.