Used ACCRETECH / TSK UF 200SA #9194869 for sale

ACCRETECH / TSK UF 200SA is a wafer prober designed to swiftly examine the electrical and physical performance of semiconductor components at a microscopic level. It is capable of testing up to two hundred samples independently or in series and can analyze both the interconnects and pads of the device. Its advanced probing system is capable of reaching speeds of up to 50kHz and offers a maximum resolution of 5um. The frame of TSK UF200SA prober is composed of a durable and temperature stable aluminum alloy. This allows the device to function under variable environmental conditions and ensures high accuracy of contact between the probe and the sample. Its main body is composed of four panels that can be rotated in order to access different points on the device. The prober also utilizes ninety degree tilt and 360° rotation technology, allowing easy access to difficult-to-reach locations. The prober is operated through a graphical user interface (GUI). This program displays the connection points of the sample to the prober, allowing the user to select the appropriate points and build a schematic of the device. Additionally, the GUI has built-in self-test functions to ensure accuracy and reliability of the measurements. ACCRETECH UF 200 SA prober is fully integrated with TSK Thunder series microscopes and is capable of probing even the most complex, highly integrated and advanced semiconductor components. It delivers accurate results within quick testing times and produces a wide range of reports, including potential failure metrics. The data collected is easily saved, allowing for confident processing and analysis. In conclusion, UF200SA prober is a reliable and efficient instrument for testing the electrical and physical properties of semiconductor components. It is highly durable, accurate, and easy to use. The user-friendly GUI and comprehensive data recovery system make it an ideal solution for any application.