Used ACCRETECH / TSK UF 300 #9203111 for sale

ACCRETECH / TSK UF 300 is a significant advancement in prober technology. This prober is designed to provide versatile probing solutions for a wide variety of semiconductor processes. It provides the ability to perform parameters such as voltage, current, capacitance, thermal, and optical measurements, as well as high-resolution imaging and imaging-assisted inspection. TSK UF 300 is equipped with a high-resolution camera and advanced software that makes it possible to capture images with resolutions up to 1 µm. This helps to identify and inspect surface defects and also assists with detailed failure analysis. It also has a general-purpose XY positioning stage that can move samples in sub-micron increments and rotate samples up to 10° with no step errors. This enables the imaging of different points on the sample, ensuring adequate coverage. It also has a wide range of interfaces, including Ethernet, VGA, and USB, that are compatible with most external testing instruments. ACCRETECH UF300 is also equipped with the award-winning TSK TomoS to provide layer-by-layer 3D inspection. With its dual optical inputs, it can detect internal and external defects which includes stack-level, film-level, multi-layer and high-power devices. It offers advanced process control that ensures accurate and reliable data and measurement results. Additionally, its advanced control system permits a wide range of automation by connecting to external peripherals. UF300 is designed to reduce overall costs and maximize productivity. It has an HVPS component that can identify limits such as voltage, current, self-test, and short-high power. It also has a flexible probe that is capable of ultra-high speed probing in a wide range of layout configurations and densities. Its complimentary ACCRETECH Measurement software can be used to analyze device identification and failure, as well as to generate various debugging reports. ACCRETECH UF 300 is a consolidated prober that can provide multiple functions with a single platform, while ensuring accurate results and reliable quality control. It is ideal for a wide range of applications including semiconductor analysis, process control, inspection, failure analysis, and manufacturing processes.