Used ACCRETECH / TSK UF 3000 #9203109 for sale

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ACCRETECH / TSK UF 3000
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Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 9203109
Wafer Size: 12"
Prober, 12" Temperature: Ambient and hot.
ACCRETECH / TSK UF 3000 is a highly advanced prober designed for precision electrical testing. The prober offers an enhanced level of testing accuracy and precision that is unmatched in the market. TSK UF 3000 comes with an all-in-one prober architecture that has been designed to cover a wide range of application needs. It features a high-precision, two-axis prober with a fully motorized X-Y positioning stage. This stage is extremely accurate and reliable, suitable even for delicate applications. The prober is also equipped with an air source for temperature control. This helps ensure that the testing conditions remain consistent and accurate. Furthermore, the machine comes with an optical microscope which is used for visual inspection and ensuring a high degree of accuracy in testing results. ACCRETECH UF3000 features a wide variety of probes that are used for different test applications. The probes can be combined depending on the requirements of the particular test. Furthermore, the probes are designed to operate in both high-frequency and low-frequency circuits. The machine also comes with a high-quality reliable testing system for various electrical tests, such as semiconductor, bypass switch, analog signal amplifier, current limiter, and pulse generator tests. The testing process also includes voltage testing, resistance testing, and diode testing. ACCRETECH / TSK UF3000 is a highly versatile machine that can be used by both beginners and experienced users. It is easy to use and requires minimal training. The prober features an intuitive graphical user interface (GUI) that makes it easier to monitor and control testing operations. Overall, UF 3000 is a reliable and highly accurate prober for a wide variety of electrical testing applications. It provides an enhanced level of accuracy and precision that is unmatched in the market.
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