Used ELECTROGLAS 4080X #158454 for sale

ELECTROGLAS 4080X is an advanced prober equipment engineered for highly efficient testing of wafers. It was designed to meet the current needs of advanced device testing, with a focus on speed, accuracy, and functionality. 4080X has a compact design that utilizes a single prober head and a compact loading system for improved operation. A high-temperature chuck is used for sample mounting, and the Vacuum Platform provides reliable, stable sample handling. It also features an XY travel range of up to 1000mm and a high-precision stepper motor for precise wafer probing operations. ELECTROGLAS 4080X also includes an on-board split chamber (CBC) capable of accommodating two wafer sizes simultaneously, enabling multiple device testing. It also features a large capacity autocollimator which provides superior vision for various prober procedures. A high-performance optical unit is used to capture high resolution images of the field of view which can be viewed and analyzed on-screen by the operator. 4080X is equipped with a high-performance temperature-controlled environment, which ensures samples stored in the prober remain in a stable condition. It also includes a RF machine that is used to measure electrical parameters such as Rf Tolerance Precision and DC Bias. ELECTROGLAS 4080X has a graphical user interface (GUI) that uses a large 128x64 dot matrix display. This provides the operator with a comprehensive view of the prober's functions in real-time. Its programmable software makes it easy for users to enter specifications for testing parameters, as well as store test results for future analysis. 4080X's sensing tool ensures high accuracy testing with a high signal-to-noise ratio. This allows for repeatable results, even in difficult process testing conditions. In addition, ELECTROGLAS 4080X is equipped with an expandable base for the integration of additional probes, enabling the testing of multiple technologies and designs. Overall, 4080X is an advanced prober asset that provides efficient, reliable testing of wafers. Its high-performance optics, comprehensive GUI and advanced sensing model make it a great choice for testing modern devices.