Used ELECTROGLAS 4085X #19607 for sale

ELECTROGLAS 4085X prober is an advanced probing and test equipment designed to accurately measure, test and analyze semiconductor devices. 4085X is a fully integrated system that offers high-performance probing capabilities and automated test analysis, along with sophisticated diagnostic assistance. It is designed to improve yield and reduce cost of test by utilizing high-speed probing, advanced fault analysis and mapping, as well as automated DRC/LVS rule-checking. ELECTROGLAS 4085X is based on ELECTROGLAS exclusive auto-positioning features, which allow for fast die placement and accurate alignment. Its closed-loop control unit offers fast and accurate positioning control, while its integrated auto-fill and adjustment machine ensures precise parallelism. Its dual-head tape measurements provide additional accuracy, while its integrated auto-load enhancement ensures optimal alignment of die faces. 4085X's probing and testing systems feature a high-speed, high-resolution interconnect tool and an advanced probe alignment asset, which includes features such as scan-based test, thermal imaging, and rapid fault localization. Its advanced fault analysis model provides graphical representation of fault locations, and its low-power, high-resolution test structures enable comprehensive testing of device structures. ELECTROGLAS 4085X also offers a comprehensive diagnostic support equipment, with intelligent and rule-based diagnostic analysis and reporting. It provides details on circuit levels, die pad layers and ESD levels, as well as built-in diagnostics and rules-checking. Additionally, its automated test sequencing system allows for comprehensive testing of individual substrates and devices. 4085X is a highly advanced semiconductor testing and analysis unit, designed to accurately measure, test and diagnose semiconductor devices. Its unique auto-positioning and alignment systems, advanced probe alignment and diagnostic support systems, and low-power, high-resolution test structures make it an ideal instrument for superior, cost-effective test and analysis of semiconductor devices.