Used TEL / TOKYO ELECTRON P-12XLn #126967 for sale
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ID: 126967
Vintage: 2002
Wafer prober, 12"
Fail mark inspection: Yes
Needle inspection option: Yes
Auto needle alignment option: Yes
Auto needle height setting: Yes
Off site marking: No
Auto card changer: Only card PGV
Camera Oblique and coaxial: Yes
TH Clamp: Yes
Card guide drawer: No
High rigidity chuck: Yes
RS232: No
GPIB: Yes
Driver marker by category: No
Cleaning unit: Z-WAPP
Z-Axis stroke long: Yes
Hot/cold chuck temperature: +50 to +150°
Internal printer: No
External printer: Yes
OCR: No
Dual cassette: No
Single cassette: Yes
SACC Cart available: Yes
Alignment board (VIP1, VIP2, VIP3, etc): VIP3
Linear scale: No
Chiller: No
Stored in a warehouse
2002 vintage.
TEL / TOKYO ELECTRON P-12XLn is a prober designed to launch precise, automated measurements and inspections. This prober is aimed at providing semiconductor users with higher throughput and improved operational efficiency, whether working on single wafer or 4-inch wafer. It is a highly suitable choice for a wide range of applications such as probing and contactor testing, micro-bump, RF testing and probing, flip-chip bump bonding, precision positioning, and many others. The prober boasts a compact body, with a maximum size of 1,540 (W) x 1,760 (D) x 1,660 (H) mm, meaning it can be placed in almost any environment. TEL/TOKYO TEL P 12 XLN equipment is capable of a broad range of tests that includes contact checking, verification, IR drop, and Dommon Area Bridging. Additionally, it offers throughput and system performance excellent for its class. The tool offers a prober construction with an excellent range of motion and accuracy. The table area is among the largest in the industry, allowing for up to 54.2 mm x 54.2 mm of traverse and 55 mm stroke. Moreover, the unit features a built-in dynamic fine feeder and linear servo motor, which contribute to creating high-precision movements and exceptional alignment accuracy. This prober also features a high-speed mounting and dismounting of wafers with a newly developed wafer changer, increasing throughput significantly. It is capable of taking measurements at 25µm accuracy and beyond. Furthermore, TOKYO ELECTRON P-12 XLN offers excellent protection of the wafers during the process via a secure seal construction with a dust-proof design to guarantee cleanliness. The machine also has an advanced software package, which permits complete control with high accuracy. This includes built-in software for several test functions, fully computer-controlled operations, and macro programming. Moreover, users have access to online information about the product with detailed specs and manuals for use. Overall, P-12XLn is an excellent choice for automated measuring and inspection needs. It ensures superior accuracy, high throughput, flexible operations, and a secure environment for the wafers. Thanks to its features and capabilities, the prober is highly suitable for a wide range of applications and industries.
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