Used AMRAY 1850FE #9112113 for sale

AMRAY 1850FE is a series of field emission scanning electron microscopes (FESEMs) manufactured and distributed by FEI Company. Its design is based on a 120kV vacuum column, an IEEE and Non-IEEE compliant electron-optical lens formation, and an Omega/X-ray detector equipment. Basically, FESEM is an imaging technique that utilizes electrons instead of light to obtain magnified images of a sample. It can magnify an object up to 300,000 times its actual size, providing a strong resolution down to 1nm. As far as 1850FE series is concerned, this top-notch microscope model is ideal for researchers and scientists who require further detail and resolution in their observations and experimentation. It easily produces similar results to the traditional SEM with greater control and range of operations. AMRAY 1850FE is fitted out with a sample manipulation chamber, with its own digital control system, offering x,y,z sample movement and tracking. In addition, a unique control unit is installed with the machine that allows for passage of the sample to the sample chamber entrance without changing components, making it well suitable for a range of applications from 2D imaging to inspection of samples with complex geometries. The EM-power machine is capable of detecting even the tiniest differences in sample size when moving between hundreds of nanometer range changes in the x and y axes. The main components of 1850FE are broken down into several distinctive features. The primary electron source to detect and image the sample comes from a coldfield emission gun. This gun diffracts the electrons into a focused electron beam that then passes into the lens column. This, in turn, directs the electron beam straight through the sample, with the deflection coil creating distortion within the beam as it travels through the sample. This provides a reversal of the contrast of the sample from dark to light, depending on the sample's material. The Electron-Optical (EO) column of the microscope is also adjustable for better and clearer transmission of the electrons. Any obstacles which are blocking the electron beam are prevented by the EO column. Lastly, the last component of AMRAY 1850FE is the detector. The detector is responsible for providing accurate images of the sample, this linear arrays of pixels collecting the electrons that strike the sample and transmitting them back to the user's monitor as an EM image or SEM micrograph. Finally, the EM detector works together with the EM-power tool in order to provide a magnified view of the sample that is far more detailed than the average microscope.