Used AMRAY 3200C #9194584 for sale

AMRAY 3200C is a scanning electron microscope (SEM) designed for high resolution imaging and analysis of a variety of materials. The SEM utilizes an electron column and detector to acquire images of the sample with resolution down to 4 nanometers lateral and 1 nanometer depth. 3200C is equipped with an accelerative voltage of up to 30 kV and a spot size of 18 nanometers, making it optimal for high resolution imaging and measurements. The field of view of the SEM is adjustable and can be adjusted up to a 2.5 nanometer diameter, allowing for precise imaging or analysis of a single spot. Operating conditions of the instrument can also be adjusted and controlled remotely to provide the desired conditions for specific applications. This includes features such as accelerating voltage, pressure, and temperature. AMRAY 3200C is equipped with several features that make it ideal for imaging and analysis. It has an automated stage to allow for precise positioning of samples, an electron source for high current imaging and analysis, and a coaxial lens that provides magnified images with minimal aberrations. Multi-channel detectors are available, allowing for various signal processing capabilities. Additionally, the SEM includes an integrated low vacuum system for analysis of non-conductive samples. The SEM also has a variety of accessories that can be used to customize the instrument setup for specific applications. This includes a cryo-transfer stage, a high temperature sample stage, as well as a range of probes for manipulating the sample while taking images or performing measurements. In addition to its imaging and analysis capabilities, 3200C is also well-suited for other applications such as sputter coating, corrosion testing, and defect analysis. The SEM allows for quick processing of samples with near-immediate feedback, making it optimal for quick diagnostic testing. Overall, AMRAY 3200C is an advanced scanning electron microscope that is suited for a variety of uses, including imaging and analysis, as well as other applications. It offers high resolution imaging and analysis capabilities, as well as adjustable conditions and a range of accessories for customizing the instrument setup for specific applications.