Used FEI Tecnai F3 #9145926 for sale

FEI Tecnai F3 Scanning Electron Microscope (SEM) is a top-of-the-line scanning electron microscope designed for advanced research applications. The unique design of the F3 enables researchers to image objects with a resolution up to 1 nm, enabling the observation and analysis of details otherwise inaccessible at this level of magnification. The F3 is equipped with an adjustable lower accelerating voltage of up to 80 kV and an upper accelerating voltage of up to 60 kV, providing a high degree of flexibility for research applications. The F3 is equipped with an adjustable, dynamic image contrast equipment which allows researchers to capture images with an essence of realism that is rarely seen in research-level scanning electron microscopes. This system can be used to enhance patterns, textures, and other image characteristics that would otherwise remain unnoticeable at high magnifications. The F3 also features a cold field emission source, providing cleaner images with less surface charging and improved resolution. The F3 features an automated digital zoom unit for improved image analysis and has the ability to further adjust image contrast levels during image analysis. Its automated image acquisition machine allows for the measurement of sample features with a high degree of accuracy. The F3 also features an auto-focus module, allowing for refined scanning in sample sections. The F3 is capable of performing EDX (Energy-Dispersive X-Ray Spectroscopy) analysis through an integral Oxford Instruments EDX tool, providing both qualitative and quantitative information of substances present in the sample. This feature allows researchers to investigate further into the properties of their sample and identify any material present down to the elemental level. The F3 is ergonomically designed and comes with an operator console and user-friendly software for easy navigation and operation. Due to its high-quality, advanced capabilities and wide range of features, the F3 is an ideal choice for researchers looking for a cutting edge scanning electron microscope for their advanced research applications.