Used HITACHI S-2700 #9046624 for sale

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ID: 9046624
Vintage: 1992
Scanning electron microscope (SEM) Noran 643C-1SSS EDS 1992 vintage.
HITACHI S-2700 is a scanning electron microscope (SEM) used for magnified imaging of hard and soft materials. It is equipped with an SEM chamber with a standard 3.2kV acceleration voltage that allows for high-resolution imaging of various materials. Owing to its high- precision imaging capabilities, S-2700 is widely used for applications such as microstructural analysis, failure analysis, metallography, and forensic analysis. The primary component of HITACHI S-2700 SEM is its field emission gun (FEG), which produces a finely focused electron beam that can be used for imaging of specimens at very high magnifications. The FEG accelerates electrons from a tungsten filament through the use of an anode voltage, resulting in a primary electron beam that is minimized in diameter as it travels to the sample. This enables focused, high-detail imaging from the specimen at very high magnifications. S-2700's wide-angle configuration also allows for larger areas to be viewed in a single image, while its 50mm objective lens helps to produce high- magnified images. The SEM also features an integral chamber design, which eliminates the need for additional atmosphere-controlling systems such as a cryostat or vacuum pressure equipment. This allows for a user-friendly environment for images to be produced more easily. HITACHI S-2700 comes with two detectors available for imaging: a secondary electron detector and a backscattered electron detector. This allows for both surface imaging and cross-sectional imaging, creating images either by emitting electrons onto the specimen or by detecting electrons scattered from the specimen for deeper imaging. The dual detector system helps capture detailed 3-D images and gives users more freedom to explore the images. S-2700 also includes a built-in computer control unit that allows for easy operation of the machine. This computer tool is equipped with an intuitive graphical user interface, as well as a wide range of processing parameters to optimize image acquisition and manipulation. Overall, HITACHI S-2700 scanning electron microscope provides a significant improvement in imaging and data acquisition over other microscopes, allowing users to produce high-resolution images of specimens at extremely high magnifications. With its dual detector asset and easy computer control model, S-2700 is an excellent choice for microstructural analysis, failure analysis, metallography, and forensic analysis.
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