Used HITACHI S-3500 #9144751 for sale
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ID: 9144751
Vintage: 2000
Scanning electron microscope (SEM)
EDS Horiba 7021-H
3.5 nm Resolution in high vacuum mode
5.0 nm Resolution in variable pressure mode
1 - 270 Pa pressure range
Scintillator back scattered detector
Operational
2000 vintage.
HITACHI S-3500 scanning electron microscope (SEM) is a powerful and versatile tool optimally designed for high-resolution imaging, with excellent depth of focus and superior surface quality. Its impressive scanning abilities provide images with excellent image contrast and detail. The design of the optical system of S-3500 SEM provides superior results due to its use of a magnetic field deflected electron beam instead of a laser. This electron beam can produce high-resolution images with a resolution down to 2 nm and the scanning chamber can hold up to 1 mm of vacuum. HITACHI S-3500 incorporates a combined electrostatic and magnetic field detector that allows for a wide range of imaging methods, from imaging down to the atomic level to surface analysis. At the same time, advanced image processing algorithms such as real-time image fusion and foresight image analysis make it possible to capture high-resolution images without sacrificing performance. S-3500 SEM is further equipped with a range of additional detectors for imaging electrons, X-rays, and other signals. These detectors allow for a broader range of imaging applications, including elemental analysis and circuit boards. Furthermore, HITACHI S-3500 can be combined with several accessories, such as a motorized stage, an apo-finder, an airlock, a table-top, and other adaptors, allowing the end-user to customize the imaging system to his or her requirements. S-3500 SEM is available with a wide range of automation, imaging, and analysis software that can help end-users determine the properties of objects of interest. This software is designed to further enhance the view and understanding of the sample under investigation. In summary, HITACHI S-3500 SEM is designed to provide superior imaging and analysis of short- and long-term processes. It offers an impressive range of imaging methods and software integration and a broad range of accessories that make it suitable for a wide range of applications in different industries.
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