Used HITACHI S-8840 #158597 for sale

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ID: 158597
Wafer Size: 6"-8"
Vintage: 1995
CD Scanning electron microscopes (SEM), 6"-8" Parts system Wafer loader Controller and display unit Upgraded to 8840 with (2) detectors EVAC Power supply Currently warehoused 1995 vintage.
HITACHI S-8840 is a scanning electron microscope (SEM) produced by HITACHI High-Technologies Corporation. It is a variable pressure SEM which provides features such as a high-performance electron optical column, a wide variety of detectors and an optional energy dispersive X-ray spectrometer (EDS). The system offers an impressive accelerating voltage range of 1-30 kV with a minimum spot size of 0.8nm and a spot resolution of 2.1nm. The energy resolution of the instrument reaches up to 0.5eV and the rapid scanning process with the help of acceleration voltage helps in achieving scans with a throughput of almost 30 frames per second. The instrument also offers exceptional aspect vision at low magnifications (100x) so that more information can be observed from a single sample. The image resolution capability of the instrument allows one to obtain very fine details of the sample. This SEM also has a high magnetic fidelity due to the optimized combination of cavity shape and magnetic materials used. HITACHI S8840 has superior imaging performance due to its state-of-the-art electron optics. Its high-performance stage has a large, non-contact motion range of up to 70mm in one dimension. Notably, S 8840 SEM is designed to be quite user-friendly in order to make sample preparation and experiment setup much easier and faster. The convenient operation screen on the system helps to facilitate current experiments, while various automation functions facilitate quick and easy operation. The system also has other features like image stacking, image presentation, particle size analysis, and automated ALD (atomic layer deposition) experiments. Overall, S-8840 is an ideal SEM for those who need accurate and speedy imaging and the ability to analyze samples with a range of different detectors. Its versatility and user-friendliness make it a widely popular scanning electron microscope for any laboratory.
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