Used JEOL JSM-6000 #9135789 for sale

JEOL JSM-6000 is an advanced scanning electron microscope (SEM) designed for high resolution imaging and analysis of surfaces with true colour elemental mapping. Utilising the latest JEOL technology, this equipment offers a resolution of 1.2nm and the capability to view and analyse specimens without sample preparation. The SEM accelerates electrons to a high energy in order to generate an imaging beam of electrons. Incoming electrons interact with specimen surface features, resulting in characteristic emissions from secondary and backscattered electrons as well as x-rays. This data is then collected by JSM-6000's state-of-the-art electronic and mechanical detection systems. The SEM includes a digitally-controlled rastered electron beam which scans the specimen surface at up to 6.2 mm/s. This allows the system to capture high-resolution images and spectra at both low and high magnification from 0.2x to 75,000x. It also offers a wide range of imaging techniques for characterisation of surface morphology, elemental composition of a sample and microstructure. JEOL JSM-6000 offers high speed acquisition power due to its ultrafast, 16-bit ALPHA-E (Advanced Logarithmic Pixel Histogram Analysis Ergonomic) model CCD camera. It also includes a wide area colour energy filter and atomprobe analyser for elemental mapping. The integrated 'Virtual Thumbnails' feature allows for the creation of up to four thumbnails of the investigated area of the specimen. In addition, JSM-6000 has an EDS (Energy Dispersive Spectroscopy) detector to enable the user to analyse sample composition and identify minerals and other constituents on a sample surface. This makes it ideal for detecting surface defects and other characteristics, as well as identifying etch pits, corrosion or flakes. Plus, the integrated dual axis goniometer unit allows for angle corrections and movement between 30 and 90 degrees along both axes. JEOL JSM-6000 provides the user with an advanced machine to measure and determine the physical and chemical properties of surfaces. It offers high resolution images and spectra, fast data acquisition and virtual thumbnails for easy reference. This makes it an ideal choice for research and industrial applications.