Used JEOL JWS 7515 #129821 for sale

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ID: 129821
Wafer inspection system.
JEOL JWS 7515 is a state-of-the-art Scanning Electron Microscope (SEM) that features high performance capabilities and advanced features. With an ultra-stable column design, JEOL JWS-7515 has superior performance characteristics and image resolution. The SEM is designed to be able to handle samples of all sizes and shapes, from nanoparticles to bulk materials. The device is driven by a high-speed digital scanning unit which helps to significantly reduce vibration and noise, allowing for the scanning of delicate and highly sensitive samples. JWS 7515 is also equipped with a robust auto-focusing equipment, a powerful ESB (electron source protection) system and an optimized deflection unit for excellent image quality. The SEM has a large range of electron optics, such as a low-noise scintillator, a digitally tuned high-resolution imaging machine, and a hybrid working distance. This allows users to tailor the electron optics to the specific needs of their sample while optimizing imaging requirements. Additionally, the device features a large wide-angle viewing field, giving users access to the entire sample surface. The SEM is equipped with a powerful thermal vacuum chamber, to provide environmentally controlled conditions, ideal for temperature-sensitive samples. It also has a specialized sample preparation chamber which allows for automated sample loading and unloading. With its powerful in-built software, JWS-7515 offers a wide range of features such as imaging control, data acquisition and analysis, enabling users to quickly and effectively gather the data they need. JEOL JWS 7515 includes an advanced imaging package and a range of options for further automated analysis. These optional packages make it possible to process images and generate graphs, charts and other data quantification. The device also supports user-defined parameters for customizing data analysis. Overall, JEOL JWS-7515 is a powerful, high-performance scanning electron microscope with advanced features and capabilities. It offers users exceptional image resolution and flexible imaging capabilities, supporting the acquisition of any type of sample. The range of automated analysis options offers users a convenient way to gather the data they need.
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