Used JEOL JWS 7550 #9028224 for sale

JEOL JWS 7550 is a scanning electron microscope (SEM) for high-resolution imaging and analytical analysis of materials. It is a type of electron microscope which uses an electron beam to produce magnified images of a specimen. JWS 7550 is an intermediate-voltage SEM featuring a field emission gun with dedicated electron optics. This combination of technology delivers ultra high-resolution imaging at high magnifications for producing detailed images of a material's microstructure. JEOL JWS 7550 features an electronically-focused system including a digital feedback system for improved resolution and contrast. It has an energy-dispersive X-ray (EDX) detector for elemental analysis of specimens, and a full field of view of 150 mm at a working distance of 28mm. This allows a wide field of view and generous space for specimens to be placed during imaging. JWS 7550 offers excellent image resolution of 1.7 nm while operating at an accelerating voltage of 1-30 kV. It has an ultra-high vacuum (UHV) chamber that enables low-vacuum imaging modes, helping to reduce the risk of contamination to a specimen during analysis. The SEM uses a high-precision electric column drive for vibration-free and accurate movement of the sample stage. This dramatically reduces the aberrations during image acquisition. It also incorporated energy filtering technology, which allows an increase in signal-to-noise ratio thereby producing higher quality images. In addition, JEOL JWS 7550 utilizes the latest Image Deblurring Mechanism (IDM) to use incident-beam information to reduce blur caused by spatial variations in medium-rare compounds. The system is equipped with automatic navigation image stitching, allowing it to capture an entire specimen field of view in a single high-resolution image. JWS 7550 is a powerful and versatile scanning electron microscope designed for industrial and academic research. Combining a high-resolution field emission gun, EDX capabilities, comprehensive stage drive mechanism, and latest IDM for image deblurring, JEOL JWS 7550 offers advanced analysis capabilities for a variety of specimen types.