Used PHILIPS / FEI Quanta 200 #9122142 for sale

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PHILIPS / FEI Quanta 200
Sold
ID: 9122142
Vintage: 2004
3D Scanning electron microscopes (SEM) 2004 vintage.
PHILIPS / FEI Quanta 200 is an industry-standard in scanning electron microscopy (SEM) systems with exceptional capabilities for imaging of a variety of materials. The SEM employs a focused electron beam to acquire high resolution images of specimens at magnifications up to 500,000x, ideal for analysis of surface structure, composition, and morphology. FEI Quanta 200 can also be used for elemental microanalysis, imaging of metals, ceramics, organics, nanostructures and biological materials. The scanning electron microscope is powered by a 60KV versatile electron source for high-resolution imaging, which is located at the column apex of the instrument. The electron source also includes spot-mode and low voltage imaging capabilities, which are essential for low contrast and high resolution imaging requirements. Furthermore, the large Field Emission Gun (FEG) offers superior output stability and the ability to analyze samples without any need for sample preparation. The FEG also features an integrated non-contact stage that ensures the highest level of accuracy. Additionally, PHILIPS Quanta 200 platform is constructed from the highest quality materials and components resulting in superior mechanical stability and performance. The interlocking structure and the intelligent design of the chassis ensures a working surface that is always stable and reliable. Quanta 200 system is also equipped with state-of-the-art control and automation technology. Its Programmable Logic Control (PLC) modules allow the user to customize an imaging sequence and features an interactive graphical user interface (GUI) that permits standardized and easy-to-use experimental setups, system control and data retrieval. PHILIPS / FEI Quanta 200 also features an advanced low vacuum imaging capabilities alongside environmental SEM (ESEM) technology for imaging delicate biological specimens. ESEM offers real-time advanced imaging of a wide range of samples with up to 80,000x magnification. Lastly, its high-resolution secondary electron (SE2) detector provides for fast and accurate imaging in both high and low vacuum imaging mode. All of this results in a powerful SEM system packed with sophisticated technology and features for imaging and analytical applications.
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