Used PHILIPS / FEI XL 30 Sirion #9145946 for sale

PHILIPS / FEI XL 30 Sirion is a scanning electron microscope (SEM) used for the analysis of surface topography, elemental composition and chemical structure, and particle size. It is suitable for a wide range of samples, including non-conductive and self-luminous materials. The microscope is equipped with a large-field cold field emission gun, which provides a field of view of up to 6.2 mm diameter and an extremely high level of elemental resolution. The beam current is adjustable up to 15 pA to allow optimal imaging on the widest range of sample types. An in-lens secondary electron detector provides high sensitivity and excellent signal-to-noise ratio. FEI XL 30 Sirion has a high-resolution moving stage drive, allowing precise control of the sample position. This is housed within a temperature-controlled and pressure-controlled chamber. The chamber can accommodate a range of specimen holders, allowing analysis of a wide range of materials, including organic compounds. The microscope also has an advanced automated navigation system, allowing users to easily switch between imaging modes. The navigation offers automatic collection of a wide range of images, including tilt and magnifications images with variations in resolutions. The automatic functions can be used to examine surface topography, elemental composition, chemical structure and particle size. PHILIPS XL 30 Sirion can also be used for 3D reconstruction, micro imaging, and deep level elemental analysis. The 3D reconstruction mode allows automatic collection of images in three dimensional form. This reconstructs a detailed view of the sample surface in real time. The micro imaging mode uses high resolution and magnification imaging to generate detailed images of small samples. Lastly, the deep level elemental analysis mode allows for the identification of elements in the sample down to an atomic level. XL 30 Sirion is an advanced SEM with excellent imaging capabilities. Its large field of view and in-lens secondary electron detector allows fast and accurate analysis, while its automated navigation system allows users to switch between imaging modes with ease. This versatile system is suitable for a range of materials, offering high definition imaging, 3D reconstructions, and deep level elemental analysis.