Used ADE / KLA / TENCOR 350 / 351 #9027395 for sale

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ADE / KLA / TENCOR 350 / 351
Sold
ID: 9027395
Wafer inspection / transfer robot for 9300 / 9600.
ADE / KLA / TENCOR 350 / 351 is a wafer testing and metrology equipment engineered for wafer testing and metrology applications. It is used to measure a variety of physical features of a wafer, such as edges, dopant levels, crystal structure, surface flatness and thickness. This system is designed to provide fast and accurate results for the analysis of numerous types of wafers including: flip-chip packages, MEMS, SOI, LED chips and GaAs. The key features and capabilities of ADE 350 / 351 include scanning electron microscopy (SEM), focused ion beam (FIB) imaging, thermal ATR spectroscopy, etc. It is equipped with high resolution imaging systems which allows for detailed observation of micro components and structures. The SEM imaging unit offers magnifications from 10X to 200000X, while the high-resolution FIB optics allows visualizing fine structures and features on various types of materials. The thermal ATR spectroscopy is a high-acuity technique used to measure dopant levels by collecting emissions from the heated sample. KLA 350 / 351 also offers sophisticated automated software solutions for detailed analysis and measurement of wafers. It is equipped with various multi-dimensional analysis algorithms for wafer inspection and metrology. These algorithms can measure an array of parameters such as feature size, 3D surface morphology, edge concentration, height distribution, etc. Furthermore, the software provides the capability of comparing multiple datasets to analyze and detect any possible defects and anomalies in the wafer. The machine is capable of measuring a number of features with an accuracy of 0.6 nanometers. It is highly efficient with a throughput rate of 5 wafers per hour. In addition, it is designed to ensure data accuracy with a noise-free environment. With robust construction and heavy-duty construction, it can be deployed in production environments without any additional protection. Additionally, it provides a range of integrity and reliability features for reliable wafer data collection. In conclusion, 350 / 351 is an ideal choice for wafer testing and metrology applications. It is engineered to provide high accuracy results for various types of wafer materials. It is equipped with sophisticated software and multi-dimensional analysis algorithms that make it an ideal choice for finding structural and compositional anomalies in wafers. It guarantees a throughput rate of 5 wafers per hour and guarantees wafers' integrity with its robust and noise-free environment.
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