Used ADE / KLA / TENCOR 7000 #9088198 for sale

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ADE / KLA / TENCOR 7000
Sold
ID: 9088198
Wafer Size: 6"
Thickness sorters, 6".
ADE / KLA / TENCOR 7000 is one of the most advanced and innovative wafer testing and metrology systems available on the market. This equipment is used for a range of tasks that include production testing, wafer characterization, defect detection, and failure analysis in minimal time. The system allows for wafer testing and metrology processes to be performed on a wide range of wafers, including thin-film substrates, flat-panel displays, microelectronics, and more. ADE 7000 can be used to accurately measure wafer surface characteristics, such as flatness, profile, and thickness. Its advanced wafer probing unit delivers an increased acceptance rate and accuracy through its precise sensor probe technology. The machine enables the prompt detection of defects, such as pitch variation, particle contamination, and surface roughness. Furthermore, it provides comprehensive 3D imaging and component analysis with excellent single-image analysis. The tool also offers a range of metrology advantages, including improved planarity, defect detection, defect location, and throughput. These features help to efficiently analyze wafer samples for one or more parameters simultaneously. Additionally, the asset has the ability to analyze and measure roughness, resistivity, and light scattering. Furthermore, it offers three-dimensional surface imaging and a scan planarity measurement to identify topographic differences and defect hotspots. In terms of power consumption, KLA 7000 is designed to have low power requirements and delivers up to ten times faster performance than traditional testing and metrology systems. The model is also equipped with an intuitive graphical user interface, which enables easy navigation and operation. This user-friendly workflow allows for the efficient and repeatable performance of complex wafer handling operations. Overall, TENCOR 7000 is designed to provide precise and reliable wafer testing and metrology results in an efficient manner. Its advanced features and capabilities make it an invaluable aid for wafer manufacturers and quality assurance professionals. By combining high-level analysis capabilities with intuitive user interface and reduced power consumption, this equipment is able to provide the most accurate and dependable wafer testing and metrology results on the market.
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