Used ADE / KLA / TENCOR NanoMapper #9081438 for sale

ADE / KLA / TENCOR NanoMapper is an X-ray equipment designed for nanomaterial characterization applications. The system consists of an X-ray source, a single-axis X-ray reflectometer, and a stage for sample positioning. The X-ray source provides a range of small-angle X-ray scattering (SAXS) and transmitted X-ray diffraction (TXRD) signals that can be used to accurately measure the phase, morphology, and microcrystallinity of nanomaterials from a few hundred nanometers down to a single nanometer in size. The reflectometer utilizes a semi-monochromatic beam of X-rays to measure scattering angles between 0.5 and 17 degrees, allowing it to acquire high-resolution data on nanostructure features. ADE NanoMapper unit features a closed X-ray source, allowing for measurements to be made in a controlled environment. This avoids sources of noise or vibration, and also helps ensure that radiation levels remain safe for personnel in the vicinity. The machine is also highly automated, with a robotic positioning tool for sample placement. This allows for highly repeatable measurements, allowing for meaningful comparisons over time and between samples. KLA NanoMapper asset produces high-resolution images that can be easily post-processed and analyzed. It is also capable of producing multi-dimensional data sets such as SAXS images, transmission X-ray diffraction (TXRD) data, 3D reconstructions, and high-resolution micrographs. This data can be used to measure the size and shape of nanomaterials; detect defects and impurities; analyze strain fields; determine diffusion coefficients; and track changes in the morphological and crystalline properties of nanomaterials over time. The model is built to meet the most stringent industrial standards, and is configured to operate with minimal maintenance and downtime. The modular design also allows for upgrades to be quickly and cost-effectively added as new applications or technology arise. The automated controls and tight tolerances ensure reliable and repeatable results from each experiment, providing meaningful feedback to scientists and materials engineers. TENCOR NanoMapper is an invaluable tool for materials characterization, and provides a wealth of information about nanomaterials.