Used ADE / KLA / TENCOR 9500 #9176508 for sale

ADE / KLA / TENCOR 9500 is a wafer testing and metrology equipment designed to test semiconductor wafers for defects and other characteristics. The system uses an advanced combination of optical, electrical, and laser technologies to measure a wide range of features, including wafer surface topography, uniformity, and critical dimension. It consists of a mainframe, optics, light sources, and computer controllers. The optics include lenses, mirrors, a scanning unit, detector unit, and motorized POS stages. The mainframe also includes a laser, microscope, scanner, and laser powers. The machine is able to detect even microscopic defects on the wafer through an optical microscopy process. It utilizes optical imaging techniques to inspect the wafer surface. The CCD camera is used to capture images of the wafer, which is then processed and analyzed by the built-in image processor. The tool is able to test the electrical properties of wafers with its built-in Electron Beam Induced Components (EBICs). These EBICs are used to analyze the conductivity of the wafer material and measure the device characteristics such as threshold voltage and gain. It is also capable of measuring the power characteristics of the wafer surface with high precision. In addition, the asset supports a wide range of metrology capabilities. These capabilities include selective area lithography, automatic feature recognition, deposition thickness measurements, and overlay alignment. It is also capable of measuring the crystalline structure of the wafer through the algorithms of the crystal pattern recognition and differential image analysis. The mainframe also includes the software tools for reliable and automatic measurements of critical dimensions, as well as for data collection, analysis, storage, and processing. ADE 9500 is a highly reliable and precise wafer testing and metrology model. It provides an efficient solution to monitor the performance and quality assurance of semiconductor wafers. With its advanced features, it can provide accurate and reliable results for wafer fabrication and design.