Used ADE / KLA / TENCOR 9700 #9184638 for sale

ADE / KLA / TENCOR 9700 is a high speed and multi-channel wafer testing and metrology equipment. It offers a wide range of capabilities for testing wafer geometry and surface features. ADE 9700 enables rapid, in-line measurement of wafers and contains a variety of optical, electrical, and mechanical subsystems to accomplish these tests. At the heart of KLA 9700 system is its powerful and versatile power and metrology electronics. It includes a high power output generator with up to three simultaneous power supplies that can deliver up to 250W per channel. Also incorporated is a high-gain 12-bit A/D converter with up to 300 MHz bandwidth. This is combined with an 8-bit D/A converter and a Peltier cooling unit. With this equipment, the machine can be used as a standalone test station, or it can interface with external equipment to perform more advanced robotic tasks. TENCOR 9700 also includes a highly accurate nano-step tool for precision control of x, y, and z-axis movements. Its 4-axis nano-step asset utilizes linear motors, which allow for a faster response time and higher accuracy. This allows the model to accurately measure the geometrical features of the wafer with micron level resolution. 9700 equipment also features an automated optical microscope. This 8-megapixel camera is able to detect features on the wafer surface with an accuracy of up to 0.5 micron. It can be used for surface measurement and topographical analysis, and enables rapid surface feature inspection. Additionally, ADE / KLA / TENCOR 9700 includes a suite of integrated software modules that allow for a complete range of measurement and analysis. The software allows the system to measure flatness, roughness, depth, and resistivity with unparalleled accuracy. It also provides real-time feedback which gives the user the ability to make timely decisions. It is also capable of analyzing parametric images, including topography, chromatic images, FD-LIBS spectra, and atomic force micrographs. ADE 9700 is a powerful and efficient unit for testing and metrology for wafers. Its high speed and multi-channel capabilities, combined with its array of innovative and accurate modules, enable rapid and precise measurements for wafer geometry and surface features.