Used ADE / KLA / TENCOR UltraScan 9600 #9193449 for sale

ADE / KLA / TENCOR UltraScan 9600 is an advanced wafer testing and metrology equipment used in the semiconductor test and manufacturing process. It combines a range of cutting-edge inspection, imaging, and analysis software packages to provide the highest quality test results. The system is designed to offer the highest level of reliability and accuracy in the test and measurement of wafers, and its versatility allows it to be used on a variety of substrates, including silicon wafers, compound semiconductor wafers, and compound semiconductor on insulator (SOI) wafers. ADE UltraScan 9600 utilizes a variety of hardware and software components to achieve the most accurate results possible. Its wafer testing and metrology capabilities include optical critical dimension, particle characterization, stress profile, overlay, material composition, and optical profiling measurements. These measurements are then analyzed and used to identify and resolve any performance issues, which can ultimately result in improved product performance and yield optimization. Advanced imaging and analysis software packages enable users to quickly and accurately analyze their results. The unit provides comprehensive defect detection capabilities, including laser patterning and defect inspection, static defect imaging, and dynamic defect imaging. This allows for the detection of a range of defects, including micro and nano-scale structures, particles, patterns, defects, and process induced shapes. The optical wafer inspection features allow for precision visualization of the entire wafer, and advanced imaging algorithms are used to analyze the proportion of both particle sizes and their placement across the entire surface of the wafer. KLA ULTRA SCAN 9600 offers full compatibility with industry standard PC platforms, allowing users to customize their systems to meet their specific needs. The machine can also be integrated with existing in-house equipment, allowing users to leverage their existing infrastructure for maximum efficiency and accuracy. The software components provide detailed reporting features that allow users to store and share their test results, and reports can be exported to a variety of third-party systems for further analysis. TENCOR ULTRA SCAN 9600 tool offers a comprehensive solution for wafer testing and metrology, providing unmatched accuracy and reliability. With its versatile inspection, analysis, and imaging capabilities, this asset is the perfect fit for any production line seeking to optimize the performance and yield of its products.