Used ADE / KLA / TENCOR UltraScan 9600 #9193450 for sale

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ID: 9193450
Wafer Size: 8"
Wafer metrology system, 8".
ADE / KLA / TENCOR UltraScan 9600 is an advanced wafer testing and metrology equipment designed to meet the needs of today's leading semiconductor manufacturers. This groundbreaking system offers a powerful combination of performance, accuracy, and repeatability, enabling wafer manufacturers to achieve the most stringent requirements and significantly reduce costs. ADE UltraScan 9600 is composed of components that are combined into a comprehensive solution. It includes an advanced full-field CCD Color Camera, an Imaging Evaluation Unit, an Analysis Display Machine, the Ultrascan Imaging Processor, and an Automatic Defect-Inspection Machine. The CCD Camera gives the tool its unique ability to capture images of sample surfaces at high speed and resolution, while the Imaging Evaluation Asset provides real-time analysis and comparison of surface textures and wafer topography. The Analysis Display Model helps operators navigate across a wide range of complex images, while the Imaging Processor analyzes images to precisely detect and characterize even the smallest features of the sample. The Automatic Defect-Inspection Machine provides an automated means of analyzing wafer surfaces to identify and characterize small defects. KLA ULTRA SCAN 9600 also features extensive connectivity options. It communicates via a variety of remote interfaces including Ethernet, serial port, and USB, as well as an optional Ethernet connection that enables secure remote access for long distance support and control. TENCOR UltraScan 9600 also comes with a user interface that allows for easy navigation of all the settings and features. This interfaces capacities include the ability to select the best imaging mode, to adjust image resolution and select color control, to manage output files, and to recalibrate the equipment when necessary. ADE / KLA / TENCOR ULTRA SCAN 9600 is capable of analyzing wafers at an unparalleled speed and accuracy. From process control to defect analysis, this system provides solutions to meet all of the needs of a fast-moving semiconductor industry. With its superior performance, flexibility, and affordability, it is an ideal choice for any wafer testing and metrology applications.
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