Used KLA / TENCOR AIT 1 #151017 for sale

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KLA / TENCOR AIT 1
Sold
ID: 151017
Particle counter for LED (Sapphire) application.
KLA / TENCOR AIT 1 is a wafer testing and metrology equipment that enables semiconductor companies to ensure product quality by testing, inspecting and characterizing their process steps across a range of critical electrical and optical parameters. This system is designed to meet high-volume production environments and support feature sizes from 2 to 32 microns on today's most advanced wafer substrates. The unit integrates wafer testing, metrology and defect review capabilities in a single platform enabling fast, repeatable and reliable performance. It features high-speed application independent non-contact 3D metrology and Defect Analysis, rapid Scanning Laser beam analysis, and Die-to-Database wafer testing capabilities. The high-resolution metrology of KLA AIT 1 helps to accurately detect defects including hillocks, keyholes, flakes and pores, as well as measure critical-dimension related parameters on die surfaces. The integrated Scanning Laser Beam Analysis performs real-time 3D shape measurements and helps to identify abnormal shape factors in the die that can have a drastic impact on device performance. It also helps identify parametric defects like before-fabricated gate short, BTI and other stress related defects that can be detected before wafer sort and assembly. The high-advantage die-to-database test solution accurately performs tests on various products including flash memory, controller memory and RF ICs. It offers a defect database solution that captures device performance details as a post-process job. This integrated solution provides a database to store particular test related parameters, analyze defect trends and easily insert data into software database. TENCOR AIT 1 machine offers a multifunction testing platform that combines high-resolution metrology, defect analysis and wafer testing capability. The wafer testing and metrology tool helps improve product yield and reduce process variation by optimizing the quality of semiconductor devices. It is an ideal asset for those seeking an automated, repeatable and reliable solution for quality control and low-failure rates.
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