Used KLA / TENCOR / PROMETRIX NC 110 Omnimap #69367 for sale

KLA / TENCOR / PROMETRIX NC 110 Omnimap is a sophisticated tool designed for the testing and metrology of semiconductor wafers. This equipment offers wide array of features, making it the ideal choice for industry professionals looking to perform advanced wafer testing and metrology. KLA NC 110 Omnimap system is built on KLA imaging platform that includes TomoVisionTM max_chroma imaging technology powered by a fully-integrated, state-of-the-art computer unit. Utilizing its high-resolution imaging capabilities, TENCOR NC 110 Omnimap is designed to detect and measure both surface contamination and defect particles on a wide range of wafers. The machine also features advanced optical features such as four-wavelength ellipsometry, topography, and spectroscopy. Additionally, the tool is capable of measuring the thickness of extremely thin films on wafers, making it a powerful and highly accurate tool for wafer metrology. NC 110 Omnimap asset has been designed with a variety of user-friendly features and intuitive software to ease use and increase efficiency. The model is capable of linking to external systems, allowing users to track, store, and compare measurement data from multiple tools. Additionally, the integrated software package provides quick and easy access to data reports and analysis tools. This makes it the ideal solution for wafer manufacturing and quality control. PROMETRIX NC 110 Omnimap equipment is also highly reliable and supports remote diagnostics and troubleshooting. It is also capable of detecting small defects and performing non-destructive testing, making it suitable for a wide range of applications. With its advanced feature set and powerful detection capabilities, KLA / TENCOR / PROMETRIX NC 110 Omnimap is the ideal choice for industries requiring high-precision wafer testing and metrology.