Used KLA / TENCOR 6000 Series Surfscan #9188561 for sale

KLA / TENCOR 6000 Series Surfscan
ID: 9188561
Wafer Size: 4"-8"
Non-patterned surface inspection system, 4"-8".
KLA / TENCOR 6000 Series Surfscan is a wafer testing and metrology equipment designed to monitor the quality of wafers at the microscopic level and ensure the highest production standards. This system is comprised of four main components: an integrated metrology platform, a suite of precision measurement tools, automated defect review software, and a comprehensive defect database. The integrated metrology platform is a multi-sensor unit that enables users to view, measure, and characterize single-sided and double-sided wafers using optical and electrical techniques. The precision measurement tools allow identification of variation in wafer quality and depth of defects that can be detected between different types of circuits. The automated defect review software highlights potential defects on the wafer and their location in a single image, providing rapid and accurate identification of the underlying issue at hand. Lastly, the comprehensive defect database records measurements of defects over time, allowing users to conduct statistical analysis of the data to further understand the nature of the defect. KLA 6000 Series Surfscan is designed for a wide range of applications, including wafer inspection, determination of device dimensions, and surface quality. Each machine is capable of measuring a variety of items such as thickness, size, microstructure, and optical properties, allowing users to determine a wide range of defect types. Furthermore, the tool is designed with a user-friendly graphical interface that allows users to quickly analyze wafers and view the results with color-coded representation. Additionally, the automated recipe approach ensures that the asset is easy to set up and use, while delivering maximum efficiency and accuracy. In summary, TENCOR 6000 Series Surfscan is an effective wafer testing and metrology model designed to maximize production accuracy and quality. With its comprehensive full-sensor platform, precision measurement tools, automated defect review software, and defect database, the equipment facilitates users in ensuring the highest quality standards for wafer production.
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