Used OLIN MICROELECTRONIC MATERIALS 25 #142444 for sale

OLIN MICROELECTRONIC MATERIALS 25 is an integrated metrology and wafer testing equipment designed specifically for measuring a variety of complex physical, electrical and material characteristics of semiconductor devices. The system is intended for use in the manufacture of semiconductors, including in the fields of optoelectronics and microelectronics. The unit is a comprehensive wafer testing and metrology solution which can measure physical, mechanical, electrical and optical properties of semiconductor devices. It incorporates a variety of state-of-the-art tools, software and accessories to support a wide range of device types, from multi-chip packaged ICs to small devices. The machine offers a number of different test technologies, including 4-point-probe, laser profilometry, capacitance/expansion measurements, index mirror profilometer, scale diagnostics, optical survey, sheet resistance and low-current electrodes. It also offers specialized subsystems such as the Nano Probe Sensor Technology (NPT) for nanomechanical testing, nano-resolution optical trench imaging and In-plane Gap Analyzer (IGA). The tool is composed of three main components - a metrology module with an integrated wafer testing station, laser sources, and a software module. The metrology module includes an integrated scanning asset, the Optiprobe scanner and the Z-axis stage. The laser sources are specifically designed for improving throughput and accuracy of wafer testing and metrology. The software module helps automate the testing and metrology process by allowing users to quickly input parameter settings, turn on/off selected tests, and generate reports. This module helps operators to save time and effort, as well as to easily identify and correct any errors or anomalies in the testing process. The model also provides a powerful user interface to facilitate the interaction between the operator and the equipment. Overall, 25 is a sophisticated wafer testing and metrology system which is specifically designed for measuring physical, electrical and optical characteristics of semiconductor devices. It offers state-of-the-art technologies, integrated scanning unit, laser sources and powerful software module to help users minimize cost and maximize throughput while ensuring accuracy and repeatability. With its comprehensive set of features, this machine is ideal for both industrial and laboratory grade applications.