Used SSM 470i #160237 for sale

SSM 470i wafer testing and metrology equipment from Cascade Microtech is a next generation design and verification workstation that provides industry-leading semiconductor test and failure analysis capabilities. This system is optimized for the most challenging test, measurement, and analysis requirements while offering cost-effective, high-performance solutions. Designed to provide consistent accuracy and repeatability, it offers up to 4,200 Kelvin testing temperature capability with a precise 200 ms dwell time. 470i is designed for a variety of technologies including, but not limited to, SOI, SiGe, BV/FET and compound semiconductors as well as GaAs and other emerging technologies. It supports design integration from chip and package to unit level, allowing efficient testing and yield optimization through precise characterization capabilities. SSM 470i is highly customizable, with a suite of tools to meet customer requirements. The machine flexible architecture offers the latest in advanced troubleshooting methods and user control of test program development, maintenance, and execution. 470i offers a wide range of wafer probing and metrology capabilities. The tool also includes an integrated set of hardware and software packages, such as the QA-370i Test Controller, the QA-370ii Test Controller, and the MT-370 Test Programmer. The unique data acquisition and analysis capabilities of this asset provide improved data accuracy and repeatability in a wide range of applications. Moreover, SSM 470i is equipped with a powerful graphic user interface, allowing easy operation and ease-of-use. It is integrated with a wide range of high performance software tools and offers automatic test programs, data collection, data analysis, and statistical analysis capabilities. 470i's software tools make creating any type of test program easy. The model has high-throughput scanning of all probe cards and chambers, reducing operator errors, as well as automatic alignment for hassle-free test programming. The equipment also offers outstanding reliability and repeatability, allowing for reliable test results on a consistent basis. Through its efficient design, advanced features and configuration options, SSM 470i wafer testing and metrology system is the perfect solution for any semiconductor test and failure analysis requirements.