Used ADE / KLA / TENCOR AWIS 3100 #9148343 for sale

ADE / KLA / TENCOR AWIS 3100 is a top-of-the-line mask and wafer inspection equipment designed to provide high-resolution inspection of semiconductor devices used in the development and production of integrated circuits, packaging, and other products. ADE AWIS 3100 combines a variety of advanced imaging, metrology, and pattern recognition technologies into a single, integrated platform. The system features a high-resolution imaging station, capable of capturing images of extremely small devices with superior accuracy. It also features an advanced SRAM memory chip analyzer for the detection of defects in on-chip SRAM cells. The SRAM memory test feature makes the tool invaluable for the analysis of components that may suffer from timing, logic, and functional defect problems. KLA AWIS 3100 also features advanced defect mapping and reporting technology, enabling engineers to rapidly locate and identify potential defects in masks and wafers. The unit can mark defect locations and provide detailed reports on possible issues. These reports can be customized to include additional information such as the defect type, its location, and other relevant details. This makes it possible for engineers to quickly assess a wide array of defects without the need for lengthy laborious testing. The machine is further equipped with advanced optical defect mapping capabilities, enabling it to detect defects on masks quickly and accurately even in the presence of non-uniform illumination. This capability makes it possible to detect defects in products prior to manufacture and therefore improve the overall yield and quality of the finished product. Finally, TENCOR AWIS 3100 is designed with a user-friendly graphical interface, making it easy to use for a wide range of engineers and technicians regardless of their technical backgrounds. As such, it is an ideal choice for semiconductor manufacturing processes requiring high resolution and accuracy inspections.