Used ADE / KLA / TENCOR NanoMapper #9183764 for sale

ADE / KLA / TENCOR NanoMapper is a high resolution X-ray imaging equipment designed for nanomaterials characterization. The system incorporates two technologies, ADE ultrahigh resolution X-ray source with advanced beamline optics, and KLA Nanoscope Profiler for nanoscale surface topography. These two technologies work together to produce unprecedented images and measurements of nanomaterials. TENCOR provides its X-ray source with a powerful nanosecond-pulsed 200 kilovolt electron injector and beam-line optics. The beam optics delivers extremely high resolution images with up to nanometer resolution. This allows for detailed structural and elemental analysis of individual nanostructures. The unit also includes charge-coupled device (CCD) detectors for X-ray imaging, as well as multichannel plate detectors for detection of electrons that come from ionic interactions. ADE / KLA / TENCOR Nanoscope Profiler is the second technology used in ADE NanoMapper. The Nanoscope provides continuous nanometer surface topography measurements, enabling the machine to measure a range of surface parameters such as surface area, roughness, and microscopy. This combines with the X-ray source to create highly detailed images of nanodyamics and surface variables. In addition to imaging, KLA NanoMapper also incorporates ADE patented Scanning Electron Microscopy (SEM) technology for detailed analysis of features on a nanometer scale. This technology includes an advanced electron microscope, which is combined with high-sensitivity electron detectors to obtain precise images of a nanostructure's morphological features. This provides users with data for further analysis and comparison. The tool is also designed to be highly portable, allowing users to take snapshots of nanostructures in any range of environments. This makes it ideal for characterizing nanomaterials in a variety of conditions. Overall, NanoMapper is an advanced X-ray imaging asset designed for nanomaterials characterization. Its combination of ultral-high resolution X-ray source, beam-line optics, CCD detectors, Nanoscope Profiler, and Scanning Electron Microscopy create a unique model that allows users to obtain unparalleled images and measurements of nanostructures with high portability.