Used SIEMENS / BRUKER Aristos MX-CR #9134640 for sale

SIEMENS / BRUKER Aristos MX-CR is a next-generation x-ray equipment designed for research in materials science and semiconductor process monitoring. The system offers an advanced combination of features including nanomaterial imaging, small area analysis, and precise sample measurement. It features a three-way oscillating source which enables uniform illumination of the sample in three dimensions without the need for goniometric sample rotation. This allows for precise measurements of small sample sizes with minimal movement. The unit is capable of utilizing variable angles of incidence, enabling users to modify a wide range of illumination parameters to achieve desired image characteristics or highlight specific material properties. The machine is controlled by a high-performance SCADA (Supervisory Control and Data Acquisition) tool compatible with both Windows and Linux operating systems. It offers various automatic controls such as sample loading, x-ray filtering, sample manipulation, and on-board data storage. The unit also includes Interlock Control features to ensure safety during operation. Furthermore, the user can employ a variety of software tools to correctly analyze acquired images and extract vital information. The asset also offers enhanced imaging capabilities through the use of the most advanced high-energy x-ray sources available on the market. Utilizing interchangeable lenses, the model is capable of producing crisp, high-resolution images revealing the details of a material or structure down to the atomic scale. It makes use of filtered air cooling and thermal compensation systems to ensure efficient and precise operation. The unit is also equipped with an intuitive user interface which allows for fast and easy operation. In addition, it features a large touchscreen display with real-time data acquisition capabilities which enables users to monitor all the necessary parameters in one glance. BRUKER Aristos MX-CR is one of the most advanced x-ray systems available today. It provides users with a wide range of capabilities to detect and analyze small areas of materials with high accuracy and precision. The equipment is an invaluable tool for researchers and other users in the field of materials science and semiconductor process monitoring.