Used ADVANTEST TR 4133B #9021737 for sale
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ADVANTEST TR 4133B is a multi-functional, four-channel electronic test equipment that is used in the manufacturing of semiconductors and digital devices. This instrument is designed to provide fast and accurate testing and verification of electrical, functional and architectural performance on a variety of digital devices. The unit has four test channels, each of which has its own independently controlled power supplies, digital I/O ports, analog inputs and outputs, as well as advanced compensation circuitry to ensure accuracy and reliability in every test and measurement. The four-channel design gives users the flexibility to independently measure a variety of parameters on the device under test. TR 4133B uses a high-speed optical interconnect for communication and control of the instrument's four channels. This provides the required data integrity at a high speed of 1Gbit/s, allowing users to conduct tests for up to four devices in parallel. This results in a significantly shorter test time as compared to other testing tools. ADVANTEST TR 4133B also contains temperature compensation circuitry to ensure that the test results are accurate and reliable, even at extreme temperatures. This is especially useful for testing in harsh environmental conditions, such as automotive and aerospace. In addition, the instrument features a wide range of advanced dynamic test and debug capabilities. This includes Pulse Voltage Testing (PVT) and Active Measurement (AM) functions. The PVT is specially designed to detect failures in components and electrical circuits, while the AM function assesses the performance of digital devices under actual operating conditions. TR 4133B is user-friendly and has a graphical user interface with intuitive menus and options. It can be operated using a PC equipped with a USB connection. The instrument is powered by a 27V DC power supply and has a power consumption of less than 0.5W. Overall, ADVANTEST TR 4133B is a versatile four-channel electronic test instrument designed for use in the manufacture of semiconductors and digital devices. It offers a high-speed optical interconnect, advanced dynamic test and debug capabilities, temperature-compensated tests and a user-friendly graphical interface. This test equipment is ideal for high-speed, efficient testing and verification of digital devices.
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