Used ANRITSU MS2712E #9187525 for sale

ANRITSU MS2712E is an electronic test equipment specially designed to meet the demanding requirements of high-speed and complex communication technologies used today. Its compact size and versatility make it an ideal tool for testing a wide variety of electronic components and systems. MS2712E features a wide frequency range of up to 3 GHz and a built-in high-resolution LCD display for easy operation and monitoring of measurements. It is also equipped with a wide variety of measurement functions and other features such as audio output and local oscillator control that offer high accuracy analysis and diagnosis. ANRITSU MS2712E has a unique spectrum analyzer that makes it easy to measure and identify signals in the frequency domain. This makes it incredibly useful for measuring the power spectral density (PSD) of a signal, a key factor in troubleshooting. The frequency response of the signal can also be compared with other signals or target models and can be used for debugging and calibration. The spectrum analyzer is further enhanced by graphical displays which makes it easy to visualize the data. It is also equipped with a vector-network-analyzer (VNA) that can analyze the frequency domain of the signal. This allows the user to analyze different parameters such as frequency, power, return loss, and impedance gain. It also has the potential to determine the time-domain characteristics of a signal and can be used to identify signal delays, line reflections, and impedance discontinuities. The VNA also has the ability to measure the stability and accuracy of the source with an internal phase noise analyzer. In addition, MS2712E features an RF power meter with a range of 0.3 GHz-3.0 GHz, offering near-field and far-field test capabilities for accurate and repeatable measurements in an efficient footprint. It also has a built-in tracking generator with a frequency range of up to 3 GHz, facilitating the operation of various sweep tests. ANRITSU MS2712E is protected from overheating and other external IP3 elements by its robust and passively cooled aluminum housing, which also reduces glare caused by natural light. It is also equipped with a trigger input/output, allowing the user to perform synchronization tests in low-noise applications. All of these features make it an essential instrument for design verification, troubleshooting, and production testing of modern electronic components and systems.