Used TEKTRONIX AWG 710 #124997 for sale
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ID: 124997
Arbitrary waveform generator
Sample rate: 4.0 GS/s
Frequency wave: 2 GHz
Point record length: 16 M
(1) Channel.
TEKTRONIX AWG 710 is an electronic test equipment for arbitrary waveform generation and repetitive waveform generation. It is widely used in R&D, production test, and component characterization applications. AWG 710 provides the necessary levels of precision and performance for benchtop applications. It features high-bandwidth, waveform generation resolution up to 16 bits, and output bandwidth up to 500 MHz (1 GHz with optional input attenuators). Its 1.8-GHz direct digital synthesizer (DDS) supports waveforms from 1 Hz to 1.8 GHz. Additionally, the system offers an 8 MB waveform memory of standard arbitrary waveforms (AWF), complex repetitive waveforms (CRWF), and vector waveforms (VWF). In terms of modulation capabilities, TEKTRONIX AWG 710 supports a range of modulation techniques such as amplitude, frequency, phase, pulse width, polarity, and more. It also offers dual independent function generators, which provide simultaneous and independent signal outputs. This makes it ideal for developing code or testing multiple systems. For ease of use, AWG 710 features a large LCD display with a menu structure, enabling ease of configuration. Additionally, the system offers computer interface and operating software that support a variety of programming languages such as C, Visual Basic, and more. In terms of performance, TEKTRONIX AWG 710 offers an excellent signal-to-noise ratio of up to 94 dBc or higher, depending on basic waveform configuration. It also supports dual HD synchronization pulses for dual signal synchronizing, robust power source, and precise signal delay measurement. AWG 710 qualifies as a universal signal source to meet diverse testing requirements. With its combination of high performance, accurate signal generation, user-friendly operation, and cost-effectiveness, TEKTRONIX AWG 710 is the ideal tool for a variety of benchmark measurements and testing applications.
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