Used DNS / DAINIPPON RE-5200 #9104130 for sale

DNS / DAINIPPON RE-5200 Ellipsometer is a highly accurate and versatile instrument used to measure the properties of thin films. It utilizes the principle of ellipsometry whereby light is reflected from a material's surface and the change in polarization is measured and recorded. This allows for the determination of film thickness, refractive index, optical constants, and birefringence of thin films and surfaces. DNS RE-5200 Ellipsometer utilizes a wavelength range of 350 - 2000 nm to provide great flexibility in performance. The machine is equipped with a three-wavelength source, 1-axis mounting rotation stage, and a unique Electronic Polarization Plane Analyzer (EPPA) which is capable of measuring anisotropic films, birefringent materials, and all kinds of optical properties. The twin-compartment sample and detector housing provide clear separation of the sample, the light source, and the detector, minimizing the influence of external light and vibration. The model also features a Viewfinder CCD Camera, which assists in the alignment of the sample, and a motorized x-axis and y-axis sample stage for precise positioning. DAINIPPON RE-5200 Ellipsometer is easy to operate with a user-friendly graphic interface. It is highly accurate with a minimum of 0.5 nanometer in film thickness measurement and 0.01 in refractive index measurement. The model also has multiple advanced features including an auto-measurement function which can measure up to 50 samples without regulation, an auto-alignment mode to correct sample position and auto-focus the light onto the sample, and a multi-sample holder which can measure a variety of film types. Additionally, the model is designed with an antibacterial body to minimize the possibility of bacterial contamination. Overall, RE-5200 Ellipsometer is an ideal candidate for any experimental setup. It offers high accuracy, flexibility, and operation ease, making it a powerful and reliable instrument for a variety of measurement applications.