Used J.A. WOOLLAM M-2000 #9189354 for sale

J.A. WOOLLAM M-2000 is an advanced optical ellipsometer that measures both the thickness and optical properties of thin films. M-2000 utilizes a patented rotating compensator technology to measure both the refractive index and extinction coefficient of thin films. The instrument features a monochromatic light source which is transmitted through two pairs of crossed linear polarizers. As light passes through the sample, the polarization state is changed and the difference in the resulting intensity is related to the optical properties of the sample. J.A. WOOLLAM M-2000 is designed for a wide range of applications, including thin film deposition, optical coating, semiconductor device fabrication, and surface science. M-2000 utilizes a Low Angle spectroscopic Ellipsometer (LASE), which allows it to measure thin films from 0-15nm with better than 0.1 degree accuracy. This combined with its unique multi-channel detector system offers the highest precision and accuracy for thin film measurements. J.A. WOOLLAM M-2000 also features a novel internal sample environment for automated temperature control. This is an advantage when measuring materials with strong temperature-dependent optical properties such as semiconductors. The instrument's automated rotation compensation system allows for smooth and accurate measurement of thin films regardless of their orientation. M-2000's built-in software interface allows users to easily control and visualize data measurements. The software provides real-time feedback, which can be used to quickly diagnose problems and adjust settings. This software also enables advanced data acquisition routines and management of experiment protocol. J.A. WOOLLAM M-2000 is a powerful and versatile instrument that can be used to measure thin film properties with excellent accuracy and precision. Its combination of advanced optical technology and automated data acquisition software makes it a valuable tool for research and development in a variety of industries.